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ISTFA 2011 : conference proceedings from the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011, San Jose Convention Center, San Jose, California

ISTFA 2011 : conference proceedings from the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011, San Jose Convention Center, San Jose, California

478 Páginas · 2011 · 3.02 MB · inglés

by Electronic Device Failure Analysis Society. & International Symposium for Testing and Failure Analysis/2011. & ASM International

“ No te aflijas, cualquier cosa que pierdes vuelve de otra forma. ” ― Rumi

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